Lam, Minh B. and Nguyen, Trung-Nhan and Ngo, Thanh-Quyen and Nguyen, Van-Sy and Phan, Trung-Tin V. and Hoang, Dinh-Khoi (2026) A Traceability-Oriented Integration Framework for Automated Optical Inspection and Barcode-Assisted Warehousing in SMT Production. International Journal of Robotics and Control Systems, 6 (2). pp. 870-887.
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Abstract
In conventional surface-mount technology (SMT) production lines, automated optical inspection (AOI) and warehousing are typically implemented as separate subsystems, which can limit system throughput, data transparency, and product traceability. This study proposes a supervisory integration framework that links AOI-based inspection and robotic handling with barcode-assisted warehousing through a PC-based supervisory application coupled with a centralized relational database. The main contribution is a unified inspection-to-warehousing workflow that associates AOI outcomes, product identity, storage contents, and warehousing status within a synchronized relational record, enabling a consistent linkage between physical printed circuit boards (PCBAs) and digital production data. The platform was implemented on a laboratory-scale SMT pilot line using an industrial AOI sensor, an industrial robot for physical handling operations, a barcode reader for product identification, and a supervisory application, implemented in C# WinForms, for integration and visualization. Experimental validation included AOI inspection of 512 PCBAs and barcode identification of 200 storage boxes under laboratory conditions. Experimental results showed that the AOI module achieved 95.2% classification accuracy for qualified boards and an 88.2% detection rate for defective units, while the barcode module successfully identified 97.5% of storage boxes on the first pass. The integration synchronization enabled automatic generation of warehousing records without manual data entry. These results support the feasibility of the proposed integration approach for enabling traceability and operational consistency in SMT production. Validation is limited to a laboratory-scale configuration, and larger-scale throughput and database stress testing remain future work.
| Item Type: | Article |
|---|---|
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Depositing User: | IJRCS ASCEE |
| Date Deposited: | 26 Jun 2026 13:42 |
| Last Modified: | 26 Jun 2026 13:42 |
| URI: | https://alxiv.org/id/eprint/1172 |
